Part# | Description | Image | In Stock | Price | Quantity |
---|---|---|---|---|---|
SN74ABT18640DL / Texas Instruments 1819030 : 3425055 | IC SCAN-TEST-DEV/TXRX 56-SSOP | In Stock | - | ||
SN74ABT18640DLR / Texas Instruments 1866086 : 3472112 | IC SCAN TEST DEVICE 18BIT 56SSOP | In Stock | - | ||
SN74ABT18646PM / Texas Instruments 1812381 : 3418401 | IC SCAN-TEST-DEV/TXRX 64-LQFP | In Stock | - | ||
SN74ABT18652PM / Texas Instruments 1848809 : 3454830 | IC SCAN-TEST-DEV/TXRX 64-LQFP | In Stock | - | ||
SN74ABT8245DW / Texas Instruments 1866599 : 3472627 | IC SCAN TEST DEV/TXRX 24-SOIC | 40 | - | ||
SN74ABT8245DWG4 / Texas Instruments 1863567 : 3469594 | IC SCAN TEST DEVICE 24SOIC | In Stock | - | ||
SN74ABT8245DWR / Texas Instruments 1859428 : 3465445 | IC SCAN TEST DEV W/OBT 24-SOIC | In Stock | - | ||
SN74ABT8543DL / Texas Instruments 1811339 : 3417363 | IC SCAN TEST DEV/TXRX 28-SSOP | In Stock | - | ||
SN74ABT8543DLR / Texas Instruments 1811039 : 3417075 | IC SCAN TEST DEVICE 28-SSOP | In Stock | - | ||
SN74ABT8543DW / Texas Instruments 1898072 : 3504092 | IC SCAN TEST DEV/TXRX 28-SOIC | In Stock | - | ||
SN74ABT8543DWR / Texas Instruments 1820326 : 3426346 | IC SCAN TEST DEVICE 28-SOIC | In Stock | - | ||
SN74ABT8543DWRG4 / Texas Instruments 1820879 : 3426898 | IC SCAN TEST DEVICE 28SOIC | In Stock | - | ||
SN74ABT8646DL / Texas Instruments 1824194 : 3430217 | IC SCAN-TEST-DEV/XCVR 28-SSOP | 261 | - | ||
SN74ABT8646DLR / Texas Instruments 1804243 : 3410259 | IC SCAN TEST DEVICE 28-SSOP | In Stock | - | ||
SN74ABT8646DW / Texas Instruments 1871747 : 3477778 | IC SCAN-TEST-DEV/XCVR 28-SOIC | In Stock | - | ||
SN74ABT8646DWR / Texas Instruments 1865097 : 3471123 | IC SCAN TEST DEVICE 28-SOIC | In Stock | - | ||
SN74ABT8646DWRG4 / Texas Instruments 1899641 : 3505671 | IC SCAN TEST DEVICE 28SOIC | In Stock | - | ||
SN74ABT8652DL / Texas Instruments 1833673 : 3439689 | IC SCAN-TEST-DEV/XCVR 28-SSOP | In Stock | - | ||
SN74ABT8652DLR / Texas Instruments 1860502 : 3466527 | IC SCAN TEST DEVICE 28-SSOP | In Stock | - | ||
SN74ABT8652DW / Texas Instruments 1807977 : 3414002 | IC SCAN TEST DEVICE 28-SOIC | In Stock | - |